Date:
April 14, 2010 - 8:30am - 4:00pm
Drexel University, Bossone Research Enterprise Center 3126 Market Street, Philadelphia, PA
Agenda
8:30 am Registration and Coffee Morning
Session Chair: Dr. Edward Basgall, CRF Drexel
9:00 am Introduction/Greetings Dr. Frank Ferrone, Associate Vice Provost for Research, Drexel University
9:10 am Latest Advances in Analytical and High-Resolution TEM/STEM Dr. Jan Ringnalda, FEI
9:40 am Measuring and cancelling stray magnetic fields for SEMs and TEMs Bill Reid, TMC
10:10 am Coffee Break
10:30 am Phase Mapping for Energy Dispersive Spectroscopy: The Future of X-ray Mapping Tara Nylese, EDAX
11:00 am Controlling floor vibration and its effect on high resolution electron microscopy Bill Reid, TMC
11:30 am Nanocharacterization in the Centralized Research Facilities at Drexel University Dr. Zhorro Nikolov, CRF Drexel
Noon Complimentary Lunch
1:00 pm CRF Lab Tours
Afternoon Session Chair: Dr. Craig Johnson, CRF Drexel
2:00 pm Latest Advances in Focused Ion Beam and Extreme Resolution Scanning Electron Microscopy Dr. Lucille Giannuzzi, FEI
2:30 pm On direct-writing methods for electrically contacting semiconductor and functional oxide nanowires Dr. Jonathan Spanier, Drexel University
3:00 pm Coffee Break
3:20 pm Characterizing Thin-Film Photovoltaics with Electron Back-Scattered Diffraction Tara Nylese, EDAX
3:50 pm Lights, Camera, Action: A Look into the Development and Applications of Ultrafast In Situ TEM Dr. Mitra Taheri, Drexel University
Registration for the seminar is free and complimentary coffee and lunch will be provided. Free parking will be available to pre-registered guests. Please register by March 31. Space is limited. For more information, please contact Craig Johnson at (215) 895-5900 or cljohnson [at] coe.drexel.edu.
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